CMI900 - For Measurement of Coating Thickness and Material Composition
CMI900
CMI900 is a cost effective, high performance XRF analyser for measurement of coating thickness and material composition.
- Measure the thickness and/or composition of plating, coating, thin films
from Ti to U
- 5 layers / 15 elements / Common elements correction
- Composition analysis of up to 15 elements simultaneously
- Measurement method according to ISO 3497, ASTM B568 and DIN 50987
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Applications
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Key Features
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Specifications
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- Multi-layer Metallic Coating Thickness Measurement
- Alloy Identification and Chemistry Analysis
- Plating solution analysis
- Gold karat assay
- Standard 50 Watt Micro-Focus X-ray Tube
- Increased count rate, improved precision
- 75 W upgrade
- Multiple Collimators
- Optimize the balance between count rate and spot sizes
- Laser Focus
- Improves system reproducibility (operator independent)
- Standard FP Software Package
- Complex application modeling
- Ease of calibration
- Slotted Chamber with motorized Z axis control
- 3 base options (fixed, mini-well, programmable)
- Ease of sample loading
- Software Available in 7 Languages
- Global user interface; English, Chinese, Japanese, Korean, French, German, Spanish
- X-ray excitation
- 50 W (50kV and 1mA) micro-focused W anode tube
- Detector
- Xe filled proportional counter with secondary filtering
- Digital Pulse Processing
- 4096 CH digital multi-channel analyzer
- Automatic signal processing including dead time correction and pulse pile up rejection
- Computer
- Pentium D, 3.0 GHz, 160 Gb HD, 512Mb RAM with MicrosoftTM XP **equivalent or better
- Power Supply
- 85~130 or 215~265 volts, with frequency range of 47Hz to 63Hz
- Working Environment
- 50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing
- Table Travel (XYZ programmable)
- 6” X 7” x 1.9” (15.2cm X 17.8cm X 4.8cm)